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About

Nanoscale Characterization Core Facility

 

Overview

The instruments in Nanoscale Characterization Core Facility are used for probing materials down to nano-scale to characterize and understand their functional properties:

  • Focused Ion Beam - Scanning Electron Microscope (FIB-SEM, FEI Versa 3D LoVac Dual Beam)
  • Auger Electron Spectroscope (Physical Electronics)
  • X-ray Photoelectron Spectroscope (Physical Electronics)
  • Tranmission Electron Microscope (JEOL JEM–2011 TEM)
  • Raman Spectroscope (Renishaw)

Other instrumentation:

  • X-ray Diffractometer (PanAlytical X’Pert (XRD))
  • Scanning Electron Microscope (JEOL JSM-6335 Field Emission Scanning Electron Microscope (FESEM)

Leadership

Katharine Dovidenko, PhD

Director

Email: dovidk2@rpi.edu

Lab managers: Chao Yang (yangc21@rpi.edu); Yechuan Chen (cheny74@rpi.edu)

 

Location and hours of operation

Hours Location

Monday - Friday                                           

           

Staffed: 9 am - 5 pm

 

Available 24/7 to trained users    

 

Center for Materials, Devices and Integrated Systems

Materials Research Center

110 8th Street

Troy, NY  12180

Links and Resources


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