Nanoscale Characterization Core Facility

Overview

The instruments in Nanoscale Characterization Core Facility are used for probing materials down to nano-scale to characterize and understand their functional properties:

• Focused Ion Beam - Scanning Electron Microscope (FIB-SEM, FEI Versa 3D LoVac Dual Beam)
• Auger Electron Spectroscope (Physical Electronics)
• X-ray Photoelectron Spectroscope (Physical Electronics)
• Tranmission Electron Microscope (JEOL JEM–2011 TEM)
• Raman Spectroscope (Renishaw)

Other instrumentation:

• X-ray Diffractometer (PanAlytical X’Pert (XRD))
• Scanning Electron Microscope (JEOL JSM-6335 Field Emission Scanning Electron Microscope (FESEM)

Leadership

Katharine Dovidenko, PhD

Director

Email: dovidk2@rpi.edu

Lab managers: Chao Yang (yangc21@rpi.edu); Yechuan Chen (cheny74@rpi.edu)

Location and hours of operation

Links and Resources